4. Optics: measuring and testing
  5. By configuration comparison
  6. With comparison to master, desired shape, or reference voltage

Makoto Taya

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Lens periphery edge processing apparatus

Abrading – Abrading process – Glass or stone abrading
Reexamination Certificate

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Lens periphery edge processing apparatus

Abrading – Abrading process – Glass or stone abrading
Reexamination Certificate

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Optical substrate inspection apparatus

Optical: systems and elements – Single channel simultaneously to or from plural channels – By partial reflection at beam splitting or combining surface
Patent

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Pattern evaluation apparatus and a method of pattern evaluation

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Profile ID: LFUS-PAI-P-561481

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