4. Radiant energy
  5. Inspection of solids or liquids by charged particles
  6. Analyte supports

Lynn J. Carroll

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Method for applying uniform pressurized film across wafer

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package
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Method for applying uniform pressurized film across wafer

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
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Method for applying uniform pressurized film across wafer

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Sample mount for a scanning electron microscope

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
Reexamination Certificate

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Sample mount for a scanning electron microscope

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1933982

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