4. Semiconductor device manufacturing: process
  5. With measuring or testing
  6. Optical characteristic sensed

Lokesh Johri

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Enhanced scanning control of charged particle beam systems

Radiant energy – Inspection of solids or liquids by charged particles
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for addressing thickness variations of...

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Lokesh Johri does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Lokesh Johri, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Lokesh Johri will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-2994489

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure