4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Lih-Huah Yiin

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Closed region defect detection system

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Method for detecting lithographically significant defects on...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Multiple design database layer inspection

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Visualization of photomask databases

Computer graphics processing and selective visual display system – Computer graphics processing – Attributes
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2204824

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