4. Semiconductor device manufacturing: process
  5. With measuring or testing

Lien-Che Ho

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Method for refreshing a flash memory

Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate

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Method of calculating the real added defect counts

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method of verifying a mask for a mask ROM

Semiconductor device manufacturing: process – With measuring or testing
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True defect monitoring through repeating defect deletion

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
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Profile ID: LFUS-PAI-P-2710993

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