Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
Inventor
active
Particle detection system with coincident detection
Surface inspection system and method of inspecting surface of wo
Wafer inspection system for distinguishing pits and particles
Wafer inspection system for distinguishing pits and particles
No associations
LandOfFree
Lee D. Clementi does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Lee D. Clementi, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Lee D. Clementi will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-215783