4. Computer-aided design and analysis of circuits and semiconductor
  5. Integrated circuit design processing
  6. Logic design processing

Laung-Terng Wang

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Computer-aided design (CAD) multiple-capture DFT system for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Computer-aided design system to automate scan synthesis at...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing
Reexamination Certificate

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Computer-aided design system to automate scan synthesis at...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and apparatus for broadcasting scan patterns in a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for broadcasting scan patterns in a...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

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Profile ID: LFUS-PAI-P-2291300

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