Semiconductor device manufacturing: process
With measuring or testing
Optical characteristic sensed
Inventor
active
Apparatus for holding and aligning a scanning electron...
Linewidth metrology of integrated circuit structures
Method and apparatus for minimizing semiconductor wafer...
Method of determining a crystallographic quality of a...
Method of mapping a surface using a probe for stylus...
No associations
LandOfFree
Larry E. Plew does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Larry E. Plew, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Larry E. Plew will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-1364478