4. Error detection/correction and fault detection/recovery
  5. Data processing system error or fault handling
  6. Reliability and availability

Kyoung-Woo Lee

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Actuator for holographic information storing apparatus

Optical: systems and elements – Deflection using a moving element – Using a periodically moving element
Reexamination Certificate

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Dual damascene process

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate

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Inter-metal dielectric patterns and method of forming the same

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Interconnections having double capping layer and method for...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Method for forming a dual damascene wiring pattern in a...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1139395

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