4. Optics: measuring and testing
  5. Sample, specimen, or standard holder or support

Konrad Knapp

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Substrate material for X-ray optical components

X-ray or gamma ray systems or devices – Specific application – Lithography
Reexamination Certificate

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Supporting plate for a photomask in an apparatus for making a mi

Optics: measuring and testing – Sample – specimen – or standard holder or support
Patent

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Profile ID: LFUS-PAI-P-1029674

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