4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Kevin J. Barcomb

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Rapid defect analysis by placement of tester fail data

Image analysis – Applications – Manufacturing or product inspection
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Rapid fail analysis of embedded objects

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2794000

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