4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Combined with electrical contact or lead
  6. Of specified configuration

Kevin H. Brelsford

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Apparatus and method for testing semiconductors

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Balancing
Reexamination Certificate

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Low dielectric constant material reinforcement for improved...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified configuration
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2739023

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