4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Kenneth Paul Parker

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Boundary-scan testing of opto-electronic devices

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method and apparatus for testing integrated circuits in a mixed-

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Profile ID: LFUS-PAI-P-1816304

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