Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
Inventor
active
Automatic photomask inspection system and apparatus
Automatic photomask inspection system and apparatus
Automatic wafer loading and pre-alignment system
Electronic control of an automatic wafer inspection system
Photomask inspection apparatus and method with improved defect d
No associations
LandOfFree
Kenneth Levy does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Kenneth Levy, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Kenneth Levy will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-1223331