4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Integrated circuit structure with electrically isolated...
  6. With contact or metallization configuration to reduce...

Keiichi Furuya

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Load test machine

Measuring and testing – Specimen stress or strain – or testing by stress or strain...
Reexamination Certificate

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Semiconductor device having a device formation region...

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – With contact or metallization configuration to reduce...
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2641581

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