4. Semiconductor device manufacturing: process
  5. With measuring or testing
  6. Electrical characteristic sensed

Kang Sup Shin

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Measuring pattern for measuring width of wire in...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method for forming interlayer insulation film in...

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method for measuring width of wire in semiconductor device using

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Kang Sup Shin does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Kang Sup Shin, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Kang Sup Shin will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-359357

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure