4. Adhesive bonding and miscellaneous chemical manufacture
  5. Differential fluid etching apparatus
  6. With microwave gas energizing means

Jyothi Singh

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Apparatus for mapping scratches in an oxide film

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Combined emissivity and radiance measurement for determination o

Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Patent

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Combined emissivity and radiance measurement for the determinati

Thermal measuring and testing – Emissivity determination
Patent

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Control of etch selectivity

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With microwave gas energizing means
Patent

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Control of etch selectivity

Etching a substrate: processes – Gas phase etching of substrate – With measuring – testing – or inspecting
Patent

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Profile ID: LFUS-PAI-P-662120

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