4. Radiant energy
  5. Inspection of solids or liquids by charged particles
  6. Methods

Julia Elvidge

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Automated method of circuit analysis

Radiant energy – Inspection of solids or liquids by charged particles – Methods
Reexamination Certificate

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Automatic focused ion beam imaging system and method

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Design analysis workstation for analyzing integrated circuits

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Design analysis workstation for analyzing integrated circuits

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2057688

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