4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Joseph Scola

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Boundary analyzer

Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate

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Model-based adaptive segmentation

Image analysis – Image segmentation
Patent

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Semiconductor device image inspection utilizing image subtractio

Image analysis – Applications – Manufacturing or product inspection
Patent

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Semiconductor device image inspection with contrast enhancement

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Semiconductor device image inspection with contrast enhancement

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1687698

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