4. Data processing: measuring, calibrating, or testing
  5. Measurement system
  6. Orientation or position

Joseph L. Ganley

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Efficient method for solving systems of discrete rotation and re

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
Patent

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Method and apparatus for computing placement costs

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and apparatus for computing placement costs by...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and apparatus for considering diagonal wiring in...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and apparatus for generating routes for groups of...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-406100

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