4. Static information storage and retrieval
  5. Floating gate
  6. Multiple values

Joseph Kucera

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Address sequencer within BIST (Built-in-Self-Test) system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Mixed mode multi-level indicator

Static information storage and retrieval – Floating gate – Multiple values
Reexamination Certificate

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Mode indicator for multi-level memory

Static information storage and retrieval – Floating gate – Multiple values
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2128813

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