4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Jonathan A. Frankle

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Method and apparatus for lightness imaging

Image analysis – Histogram processing – For setting a threshold
Patent

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Method for designing large standard-cell base integrated...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1546852

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