4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Jon R. Mandeville

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Method for automatic optical inspection analysis of integrated c

Image analysis – Histogram processing – For setting a threshold
Patent

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System for detecting and analyzing rounded objects

Image analysis – Histogram processing – For setting a threshold
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Tandem linear scanning confocal imaging system with focal volume

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system
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Profile ID: LFUS-PAI-P-274164

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