4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Signal generation or waveform shaping

John William Kay

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High speed electron beam lithography pattern processing system

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
Patent

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Methods and systems for testing digital-to-analog...

Coded data generation or conversion – Converter calibration or testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1132890

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