4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Signal generation or waveform shaping

John Matthew Safran

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High speed electron beam lithography pattern processing system

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
Patent

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Programming current stabilized electrical fuse programming...

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – Fusible link or intentional destruct circuit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1132896

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