4. Optics: measuring and testing
  5. By polarized light examination
  6. With birefringent element

John Leonard Young

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Apparatus and system for electro magnetic field measurements...

Optics: measuring and testing – By polarized light examination – With birefringent element
Reexamination Certificate

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Methods and systems of thick semiconductor drift detector...

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation
Reexamination Certificate

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Recycling pump-beam method and system for a high-power...

Coherent light generators – Particular beam control device – Nonlinear device
Reexamination Certificate

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