4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

John J. Plombon

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Fluorine-free precursors and methods for the deposition of...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
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Interpolated height determination in an atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Using unstable nitrides to form semiconductor structures

Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2028795

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