4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

Jian-Ping Zhuang

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Dual stage instrument for scanning a specimen

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Dual stage instrument for scanning a specimen

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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System for locating a feature of a surface

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Profile ID: LFUS-PAI-P-1250026

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