4. Electronic digital logic circuitry
  5. Clocking or synchronizing of logic stages or gates
  6. Field-effect transistor

Jerry C. Kao

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Cascaded test circuit with inter-bitline drive devices for...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Method and apparatus for implementing subthreshold leakage...

Electronic digital logic circuitry – Clocking or synchronizing of logic stages or gates – Field-effect transistor
Reexamination Certificate

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Method for evaluating memory cell performance

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Storage array including a local clock buffer with...

Static information storage and retrieval – Addressing – Sync/clocking
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Profile ID: LFUS-PAI-P-3051777

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