4. Data processing: measuring, calibrating, or testing
  5. Measurement system
  6. Temperature measuring system

Jennifer V. Muncy

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Electronic components on trenched substrates and method of...

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Reexamination Certificate

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Tracking thermal mini-cycle stress

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2320969

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