4. Semiconductor device manufacturing: process
  5. With measuring or testing

Jean-Claude Oberlin

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Characterizing of silicon-germanium areas on silicon

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method of formation of a capacitor on an integrated circuit

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method of manufacturing an integrated capacitor onto a...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Jean-Claude Oberlin does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Jean-Claude Oberlin, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Jean-Claude Oberlin will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-2107651

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure