4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Chemical analysis

Jay Sanford Burnham

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Copper contamination detection method and system for...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
Reexamination Certificate

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Method of fabricating a nitrided silicon oxide gate...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – By reaction with substrate
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2251678

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