4. Excavating

James Alan Turnquist

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Apparatus and method for successively generating an event to...

Electrical computers and digital processing systems: support – Synchronization of clock or timing signals – data – or pulses – Using delay
Reexamination Certificate

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Data failure memory compaction for semiconductor test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Delta time event based test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Event based IC test system

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Event based semiconductor test system

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
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Profile ID: LFUS-PAI-P-1024131

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