4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital data error correction

Jae-June Kim

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Method for manufacturing wafer level chip scale package...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor
Reexamination Certificate

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Method for optimizing viterbi detector threshold values

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Patent

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Overvoltage and surge protection circuit in a hard disk drive

Electricity: electrical systems and devices – Safety and protection of systems and devices – With specific voltage responsive fault sensor
Patent

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Profile ID: LFUS-PAI-P-169090

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