4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

iRoc Technologies

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Hardened memory cell

Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate

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Logic circuit protected against transient disturbances

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Logic circuit protected against transient disturbances

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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