4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

Horacio D. Espinosa

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Nanoelectromechanical bistable cantilever device

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Physical deformation
Reexamination Certificate

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Nanotipped device and method

Measuring and testing – Surface and cutting edge testing – Roughness
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Nanotipped device and method

Chemical apparatus and process disinfecting – deodorizing – preser – Control element responsive to a sensed operating condition
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2325536

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