4. Optics: measuring and testing
  5. By polarized light examination
  6. With light attenuation

Hoon Jung Oh

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Capacitor for a semiconductor device and manufacturing...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Method of forming a charge storage electrode having a...

Semiconductor device manufacturing: process – Making passive device – Stacked capacitor
Reexamination Certificate

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Method of measuring surface area variation rate of a polysilicon

Optics: measuring and testing – By polarized light examination – With light attenuation
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Profile ID: LFUS-PAI-P-588397

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