4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition

Hiroyuki Maekawa

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Display device, display program storage medium and display...

Computer graphics processing and selective visual display system – Computer graphics processing – Graph generating
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Information processing apparatus, information processing...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Method and device for surface inspection

Optics: measuring and testing – Dimension – Thickness
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Method, apparatus and computer product for identifying the...

Electrical computers and digital data processing systems: input/ – Input/output data processing – Peripheral configuration
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Surface inspecting method and device

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Profile ID: LFUS-PAI-P-2250069

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