4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition

Hidetsugu Ishida

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Inspection method, inspection apparatus and method of production

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Semiconductor device having buried boron and carbon regions

Active solid-state devices (e.g. – transistors – solid-state diode – With specified dopant
Reexamination Certificate

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Semiconductor device having buried boron and carbon regions,...

Active solid-state devices (e.g. – transistors – solid-state diode – With specified dopant
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1254482

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