4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition

Hidetoshi Utsuro

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Angle measuring device and method

Optics: measuring and testing – Angle measuring or angular axial alignment – Apex of angle at observing or detecting station
Reexamination Certificate

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Method and apparatus for inspection of optical component

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Method and apparatus for inspection of optical component

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2380964

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