4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Hidenobu Matsumura

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High speed test pattern evaluation apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor integrated circuit design and evaluation...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Semiconductor integrated circuit evaluation system

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Profile ID: LFUS-PAI-P-1214983

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