4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

Harry Jonathon Mamin

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Atomic force microscope system with angled cantilever having int

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Patent

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Atomic force microscope system with cantilever having unbiased s

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Atomic force microscope system with multi-directional voice coil

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Atomic force microscopy data storage system with tracking servo

Dynamic information storage or retrieval – Specific detail of information handling portion of system – Electrical modification or sensing of storage medium
Patent

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Optical disk data storage system with improved solid immersion l

Dynamic information storage or retrieval – Specific detail of information handling portion of system – Radiation beam modification of or by storage medium
Patent

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Profile ID: LFUS-PAI-P-1056992

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