4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. For transfer function determination

Harry D. Foster

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Managing formal verification complexity of designs with...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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System and method for efficient verification of functional...

Data processing: measuring – calibrating – or testing – Testing system – For transfer function determination
Reexamination Certificate

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System and method for evaluating functional coverage linked...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2143587

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