4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

Hans K. Pew

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High throughput reflectivity and resolution x-ray dispersive and

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Mobile miniature X-ray source

X-ray or gamma ray systems or devices – Source – Electron tube
Reexamination Certificate

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Profile ID: LFUS-PAI-P-523727

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