4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

Hancheng Liang

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Apparatus and methods for measuring noise in a device

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate

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MOSFET modeling for IC design accurate for high frequencies

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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MOSFET modeling for IC design accurate for high frequencies

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

MOSFET modeling for IC design accurate for high frequencies

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

MOSFET modeling for IC design accurate for high frequencies

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

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Profile ID: LFUS-PAI-P-2600948

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