4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. For fault location

H. Daniel Schurmann

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Dual metal integration scheme based on full silicidation of...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
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Formation of improved SOI substrates using bulk...

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Having air-gap dielectric
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Method for detecting power plane-to-power plane shorts and...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Method for eliminating negative slack in a netlist via...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Method of physical planning voltage islands for ASICs and...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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