4. Static information storage and retrieval
  5. Read/write circuit
  6. Including reference or bias voltage generator

Gyo Soo Chu

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Internal voltage generating circuit and semiconductor memory...

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Temperature sensing circuit and semiconductor memory device...

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3305891

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