4. Optical waveguides
  5. With optical coupler
  6. Particular coupling structure

Gustav Edward Derkits

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Detecting trace levels of copper

Semiconductor device manufacturing: process – With measuring or testing
Patent

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In-situ automated contactless thickness measurement for...

Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate

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Reflective array multiplexer with polarization compensation

Optical waveguides – With optical coupler – Particular coupling structure
Patent

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Profile ID: LFUS-PAI-P-1347580

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