4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Global Unichip Corporation

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Error write protection circuit used in semiconductor memory...

Static information storage and retrieval – Read/write circuit – Precharge
Reexamination Certificate

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Programmable built in self test for embedded DRAM

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Test pattern generator for SRAM and DRAM

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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