4. Chemistry: analytical and immunological testing
  5. Optical result

Gerd Schneider

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Method and apparatus for analyzing the composition of the exhaus

Chemistry: analytical and immunological testing – Optical result
Patent

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Method for examining structures on a semiconductor substrate

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Reexamination Certificate

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X-ray microscope with zone plates

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Patent

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Profile ID: LFUS-PAI-P-339118

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